Quality & Reliability
Technology
Quality is non-negotiable. Our comprehensive quality management system ensures every wafer, package, and die meets the most stringent automotive and industrial reliability standards.
Certifications & Standards
AEC-Q100
Automotive IC qualification
ISO 9001:2015
Quality management system
IATF 16949
Automotive quality standard
ISO 14001
Environmental management
Reliability Testing
Comprehensive reliability qualification covering temperature cycling, moisture sensitivity, and high-temperature operating life testing.
- HTOL — High Temperature Operating Life
- TC — Temperature Cycling (-65°C to +150°C)
- MSL — Moisture Sensitivity Level testing
- HAST — Highly Accelerated Stress Test
- ESD — Electrostatic Discharge qualification
Metrology & Inspection
State-of-the-art inline and end-of-line metrology for process control and defect detection.
- CD-SEM & overlay metrology
- Automated optical inspection (AOI)
- X-ray fluorescence (XRF) analysis
- SAM — Scanning Acoustic Microscopy
- FIB — Focused Ion Beam cross-sections
Quality Metrics
< 0.1DPPM
Defect Rate
99.8%
Yield Rate
100%
Wafer Traceability
24/7
SPC Monitoring